Zinc oxide film grown using successive chemical solution deposition (SCSD) technique
Abstract
Zinc oxide (ZnO) films were grown on glass substrates by successive chemical solution dipping (SCSD) technique using Sodium zincate solution and hot water bath. Raman Spectroscopy, Energy-Dispersive X-Ray Spectroscopy and X-Ray Diffraction results confirmed the chemical identity of the films as ZnO. The (2 0 1) maximum peak and two (2) other low peaks at (2 0 0) and (0 0 2) can be associated with wurtzite ZnO structure. EDX results showed the presence of both elements Zinc and Oxygen. Varying the dipping time (2s, 4s ,6s) and number of dipping (100x, 150x) produced a mixture of globular and fibrous microstructure of ZnO as observed using scanning electron microscopy. Increasing the dipping time to 6s at 150x number of dipping favored the formation of purely rod-like structure of ZnO.