Fabrication of Si nanopillar by reactive ion etching using a gas discharge ion source
Abstract
We report a straightforward technique for the fabrication of Si nanopillar. CF₄ plasma produced from a low power DC gas discharge ion source was utilized to etch the silicon substrate. It was hypothesized that Cr atoms from the stainless steel exit aperture of the ion source were sputtered and deposited on the Si substrate serving as nanomask for the reactive ion etching. Other than sample cleaning, no additional pre and post treatments were done on the silicon sample. Moreover, no external heating was introduced on the substrate. The GDIS offers an alternative process of creating Si nanopillars with diameter < 100 nm and comparably high aspect ratio (~ 6-8).