X-ray diffraction analysis of Au-assisted GaAs nanowires grown on Si substrates via molecular beam epitaxy
Abstract
Crystalline quality and structural properties of molecular beam epitaxy (MBE)-grown gallium arsenide (GaAs) nanowires on silicon (100) and (111) substrates were investigated using x-ray diffraction (XRD) measurements. Three sets of gold (Au) nanoparticles with different average sizes and densities were used as metal-catalysts that predefine the growth areas for the nanowires on both substrates and direct growth in a highly anisotropic or 1-D manner. The presence of a GaAs peak corresponding to (004) crystal plane suggests that the synthesized nanowires on both substrates have cubic zincblende structure with lattice parameter a = 5.64 Å.