Characterization of laser ablation sites on silicon
Abstract
Laser ablation of silicon with a Q-switched 1064nm Nd:YAG laser is studied and SEM images of the ablated sites were obtained. The ablation crater diameter and sidewall height were measured from these images. The ratio of the perimeter with area of the craters was calculated by implementing an image processing algorithm. The ratio obtained was compared to the laser spot size of a Gaussian beam and a minimum percentage error of 7.6% was incurred. An ablation threshold of ~3 J/cm2 for silicon was experimentally measured which deviates from the ~9.32 J/cm2 predicted by the classical thermal laser ablation model.