Investigation on the growth, design and scattering mechanisms of an AlxGa1-xAs/GaAs high electron mobility transistor exceeding 200,000 cm2/Vs
Abstract
Improving the mobility and ascertaining the quality of high electron mobility transistors have always been a major concern in the field of semiconductors. With the improved growth procedure in the Condensed Matter Physics Laboratory, effectiveness in layer deposition by molecular beam epitaxy (MBE) has been achieved. A HEMT of 200,000 cm2/Vs electron mobility at 10K was obtained, the highest electron mobility to date in the country since 2002. We found that interface roughness scattering limits the electron mobility at 10K-40K, while above 100K optical polar scattering was dominant. The high electron mobility of the grown HEMT and the reduced contribution of the different scattering mechanisms indicated the improved quality of the HEMT and the smoothness of deposition during growth.