Laser deposition of Bi2Sr2CaCu2O8+δ on Si (111) substrate at room temperature

Authors

  • Jaziel R. Vitug National Institute of Physics, University of the Philippines Diliman
  • Jeffrey C. de Vero National Institute of Physics, University of the Philippines Diliman
  • Jacque Lynn F. Gabayno National Institute of Physics, University of the Philippines Diliman
  • Wilson O. Garcia National Institute of Physics, University of the Philippines Diliman
  • Roland V. Sarmago National Institute of Physics, University of the Philippines Diliman

Abstract

Pulsed laser deposition is used to fabricate Bi2Sr2CaCu2O8+δ films on silicon (111) substrate at room temperature. A Q-switched 1064 nm pulsed Nd:YAG laser with repetition rate of 10Hz and pulse duration of 8ns (FWHM) is used as the excitation source. X-ray diffraction (XRD) measurements confirm more c-axis oriented 2212 phase for longer deposition time of as-deposited film and an intergrowth of 2201 phase for the post-annealed film. Scanning electron microscopy shows a layered film structure with some microcracks on the surface of the post annealed film due to the difference in the thermal expansion coefficient of BSCCO and silicon. Resistance-temperature (R-T) measurement confirms the superconductivity of the film with a critical temperature Tc of 57K.

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Issue

Article ID

SPP-2008-4A-01

Section

Materials Physics

Published

2008-10-22

How to Cite

[1]
JR Vitug, JC de Vero, JLF Gabayno, WO Garcia, and RV Sarmago, Laser deposition of Bi2Sr2CaCu2O8+δ on Si (111) substrate at room temperature, Proceedings of the Samahang Pisika ng Pilipinas 26, SPP-2008-4A-01 (2008). URL: https://proceedings.spp-online.org/article/view/SPP-2008-4A-01.