Fabrication of submicron V-gate via chemical etching
Abstract
In this paper, a technique to fabricate a submicron V-gate was introduced. Gate patterns with different sizes of mask opening transferred onto the substrate by UV lithography was etched chemically using NH4OH:H2O2:H2O (3:1:50). In the etching process, several parameters were investigated including crystallographic orientation, etching time, and etchant temperature. SEM images showed that for a 2 µm gate-length mask opening, preferential etching for 8 minutes of the (111) plane of the GaAs substrate produced a 393 nm V-gate. I-V characteristics of the electronbeam deposited Ti/Au (105 Å/505 Å) metals showed that Schottky contact was formed with the V-groove submicron gate.