A system for determining angular tilt of a CCD and/or CMOS image sensor by image Fourier transform analysis
Abstract
We propose a system that makes use of a laser setup and a bar chart to determine the tilt of an image sensor. Fourier analysis is performed on sample images where the image sensor itself is used to determine overall sensor tilt. In comparison to other techniques such as SAM, the proposed technique is fast and non-destructive. The system was able to determine sensor tilt to 25% RMSE compared with an ideal or simulated setup. The system can be adapted and used as a quick Good/No Good test for industrial applications where it can have advantages being that the setup itself is simple and can easily be implemented in a production line.
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