Characteristics of amplitude masks for wavefront sensing via phase retrieval and a volume speckle field

Abstract

Phase retrieval using a volume speckle field can be applied to wavefront sensing by employing a random amplitude mask. The principles of the phase retrieval method are reviewed. The accuracy and rate of convergence of the phase reconstruction depend on the quality of the mask used. The parameters of a binary and a grayscale amplitude mask that affect the phase retrieval are investigated numerically. Smaller mask pixels yield better quality reconstructions. No significant difference in the reconstructions was observed when a binary mask or grayscale mask is used. These simulations demonstrate the influences of mask parameters that are critical in its design and fabrication.