Effects of x-ray radiation on polyaniline characteristics
Abstract
Chemically synthesized Polyaniline was formed into thin films and was doped with sulfuric acid. It was exposed to x-rays with 40, 60, 80 and 100 kilovoltage potentials (kVp). Electrical measurements were performed several times after irradiation. Structural characterizations were also done using the Fourier Transform Infrared Spectroscopy (FTIR). The results showed that the conductivity of the film increased when x-ray energy is increased. There is a high possibility that the increase in the conductivity, as caused by the increase in the carrier concentration, can be attributed to the increase in the number of protonated sites. FTIR spectra further revealed that no degradation of the film happened upon x-ray exposure. The results of this study indicate that PAni film derived from chemical synthesis is sensitive to x-ray radiation and that there is a possibility of using it as a basic sensor component in controlling and measuring electromagnetic radiation.
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