Strain mechanism in the epitaxially lifted off GaAs film bonded to MgO
Abstract
Thermal strain effects in GaAs film bonded to MgO using epitaxial lift off (ELO) technique were investigated by means of low temperature photoluminescence spectroscopy and reflectivity. As compared to the non-ELO-prepared sample, the GaAs bonded to MgO, showed a clear valence band splitting which was due to the difference in the thermal expansion coefficients of the GaAs and MgO. Aside from the valence band splitting, the energy gap of the GaAs blue shifted, which translates to a compressive strain introduced in GaAs film. This demonstrates that the use of ELO technique can be extended to introduce compressive strain in GaAs.