Thickness measurement of nano-size carrageenan thin films by x-ray reflectivity and total-reflection x-ray fluorescence spectroscopy

Authors

Vallerie Ann A. Innis Applied Physics Research Group, Philippine Nuclear Research Institute
Pablo P. Saligan Applied Physics Research Group, Philippine Nuclear Research Institute
Virginia S. Calix Applied Physics Research Group, Philippine Nuclear Research Institute
Roland V. Sarmago National Institute of Physics, University of the Philippines Diliman

Abstract

Thickness measurements of nano-size carrageenan thin films, fabricated by the spin-coating process, were done by x-ray grazing incidence techniques namely: x-ray reflectivity (XRR) and total-reflection x-ray fluorescence (TXRF) spectroscopy. Thickness measurements of the thin films by XRR showed that the concentration of the solution was the main determinant for final film thickness over other process parameters. Film thickness as low as 20nm were measured by this technique. Sulfur fluorescent intensities derived from the TXRF measurement showed a linear relationship with the measured thicknesses by XRR.

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Issue

2006: Proceedings of the 24th Samahang Pisika ng Pilipinas National Physics Congress

Article ID

SPP-2006-2B-02

Section

Materials Science

Published

2006-10-25

How to Cite

[1]

VAA Innis, PP Saligan, VS Calix, and RV Sarmago, Thickness measurement of nano-size carrageenan thin films by x-ray reflectivity and total-reflection x-ray fluorescence spectroscopy, Proceedings of the Samahang Pisika ng Pilipinas 24, SPP-2006-2B-02 (2006). URL: https://proceedings.spp-online.org/article/view/SPP-2006-2B-02.