Thickness measurement of nano-size carrageenan thin films by x-ray reflectivity and total-reflection x-ray fluorescence spectroscopy
Abstract
Thickness measurements of nano-size carrageenan thin films, fabricated by the spin-coating process, were done by x-ray grazing incidence techniques namely: x-ray reflectivity (XRR) and total-reflection x-ray fluorescence (TXRF) spectroscopy. Thickness measurements of the thin films by XRR showed that the concentration of the solution was the main determinant for final film thickness over other process parameters. Film thickness as low as 20nm were measured by this technique. Sulfur fluorescent intensities derived from the TXRF measurement showed a linear relationship with the measured thicknesses by XRR.
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