Modeling the profile of an oxide-confined p-i-n light-emitting diode
Abstract
Oxide-confined light-emitting diodes were fabricated and tested. Emission measurements were performed on three devices, namely: unoxidized device A, oxidized device B with 114.67 μm-diameter aperture, and oxidized device C with 37.12 μm-diameter aperture.
The profile of the devices was modeled by considering the sloping mesa edge and oxide front. The device emission spectra were then simulated using the model, and were compared with the experimentally obtained spectra. Both experimental and calculated spectra showed similar trends, that is, further oxidation of the AlAs layers in the devices leads to the suppression of the peaks associated with the cavity modes and to the broadening of the emission spectra.