Determination of the refractive index of tin telluride using terahertz spectroscopy

Authors

Gilbert A. Diwa ⋅ JP Physics Department, De La Salle University, Philippines and Institute for Molecular Science, Okazaki, Japan
Gil Nonato Santos ⋅ PH Physics Department, De La Salle University
Reuben Quiroga ⋅ PH Physics Department, De La Salle University

Abstract

The complex refractive indices of tin telluride (SnTe) films deposited on glass substrate are determined using terahertz-time domain spectroscopy (THz-TDS). It is determined that the average values of the real and imaginary parts of the complex refractive index of the film deposited at 30°C are 4.8 and 3.5, respectively. As for the film deposited at 50°C, the average values of the real and imaginary parts are found to be 5.6 and 4.0, respectively. It is observed that at 0.5 THz the real part of the complex refractive index shows a sudden increase. This can be attributed to the increase in the SnTe film's resistivity that slows down the propagation of the electromagnetic (EM) pulse. On the other hand, the imaginary part depicts an abrupt decrease also at 0.5 THz, which can be ascribed to the compression of the EM pulse as it propagates through the sample.

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Issue

2004: Proceedings of the 22nd Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2004-1A-01

Section

Optics and Photonics

Published

2004-10-25

How to Cite

[1]

GA Diwa, GN Santos, and R Quiroga, Determination of the refractive index of tin telluride using terahertz spectroscopy, Proceedings of the Samahang Pisika ng Pilipinas 22, SPP-2004-1A-01 (2004). URL: https://proceedings.spp-online.org/article/view/SPP-2004-1A-01.