Liquid phase epitaxial growth of InxGa1−xAs on GaAs substrate
Abstract
InxGa1−xAs (0 < x < 0.03) epilayers were grown on GaAs substrate using liquid phase epitaxy (LPE). Equilibrium cooling and step-cooling techniques were utilized for the epitaxial growth process. Equilibrium cooling technique was able to grow an 18 μm film with an In mole fraction of approximately 0.01. On the other hand using step-cooling technique as an attempt to increase In mole fraction yielded a 0.6 μm and 10 μm films with mole fractions of 0.017 and 0.03, respectively. Film thicknesses were measured using SEM and mole fractions were computed using the XRD results. 10K PL verified the mole fraction obtained from XRD.