Preparation and surface characterization of MEH-PPV thin semiconducting film as potential substrate for optical waveguide

Authors

Carlito S. Ponseca Jr. ⋅ PH Electronics and Communications Engineering Department, Mapúa Institute of Technology
Ivan B. Culaba ⋅ PH Department of Physics, Ateneo de Manila University
Erwin P. Enriquez ⋅ PH Department of Chemistry, Ateneo de Manila University
Felicito S. Caluyo ⋅ PH Electronics and Communications Engineering Department, De La Salle University
Alvin B. Culaba ⋅ PH Mechanical Engineering Department, De La Salle University

Abstract

In this paper, we report preliminary results on the preparation and surface characterization of poly[2-methoxy-5-(2'-ethylhexyloxy-1,4] phenylenevinylene (MEH-PPV) thin semiconducting film as possible substrate material for a slab optical waveguide. The polymer was deposited onto low index of refraction (n = 1.34) magnesium fluoride (MgF₂) coated on a base made of glass (SiO₂). Optical and scanning electron microscopy show surface defects (pinholes) on the MgF₂ film on SiO₂. A relatively uniform film of MEH-PPV on MgF₂/SiO₂ was obtained by spin-coating the polymer solution. Defects and striations on the prepared layered structures were also observed. The layers consisting of MEH-PPV/MgF₂/SiO₂ and MgF₂/SiO₂ show similar spectra with high transmittance in the region between 300-800 nm. The absorbance spectrum of MEH-PPV shows a marked peak at low value wavelengths, which agrees with the literature.

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Issue

2003: Proceedings of the 21st Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2003-PB-07

Section

Poster Session PB

Published

2003-10-22

How to Cite

[1]

CS Ponseca, IB Culaba, EP Enriquez, FS Caluyo, and AB Culaba, Preparation and surface characterization of MEH-PPV thin semiconducting film as potential substrate for optical waveguide, Proceedings of the Samahang Pisika ng Pilipinas 21, SPP-2003-PB-07 (2003). URL: https://proceedings.spp-online.org/article/view/SPP-2003-PB-07.