Preparation and surface characterization of MEH-PPV thin semiconducting film as potential substrate for optical waveguide

Authors

Carlito S. Ponseca Jr. Electronics and Communications Engineering Department, Mapúa Institute of Technology
Ivan B. Culaba Department of Physics, Ateneo de Manila University
Erwin P. Enriquez Department of Chemistry, Ateneo de Manila University
Felicito S. Caluyo Electronics and Communications Engineering Department, De La Salle University
Alvin B. Culaba Mechanical Engineering Department, De La Salle University

Abstract

In this paper, we report preliminary results on the preparation and surface characterization of poly[2-methoxy-5-(2'-ethylhexyloxy-1,4] phenylenevinylene (MEH-PPV) thin semiconducting film as possible substrate material for a slab optical waveguide. The polymer was deposited onto low index of refraction (n = 1.34) magnesium fluoride (MgF₂) coated on a base made of glass (SiO₂). Optical and scanning electron microscopy show surface defects (pinholes) on the MgF₂ film on SiO₂. A relatively uniform film of MEH-PPV on MgF₂/SiO₂ was obtained by spin-coating the polymer solution. Defects and striations on the prepared layered structures were also observed. The layers consisting of MEH-PPV/MgF₂/SiO₂ and MgF₂/SiO₂ show similar spectra with high transmittance in the region between 300-800 nm. The absorbance spectrum of MEH-PPV shows a marked peak at low value wavelengths, which agrees with the literature.

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Issue

2003: Proceedings of the 21st Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2003-PB-07

Section

Poster Session PB

Published

2003-10-22

How to Cite

[1]

CS Ponseca, IB Culaba, EP Enriquez, FS Caluyo, and AB Culaba, Preparation and surface characterization of MEH-PPV thin semiconducting film as potential substrate for optical waveguide, Proceedings of the Samahang Pisika ng Pilipinas 21, SPP-2003-PB-07 (2003). URL: https://proceedings.spp-online.org/article/view/SPP-2003-PB-07.