Current confinement in an optical device using AlAs oxide

Authors

  • Alfred Samson National Institute of Physics, University of the Philippines Diliman
  • Francisco Agra National Institute of Physics, University of the Philippines Diliman
  • Gabriel Manasan National Institute of Physics, University of the Philippines Diliman
  • Elmer Estacio National Institute of Physics, University of the Philippines Diliman
  • Arnita Podpod National Institute of Physics, University of the Philippines Diliman
  • Armando Somintac National Institute of Physics, University of the Philippines Diliman
  • Arnel Salvador National Institute of Physics, University of the Philippines Diliman

Abstract

Oxidation of AlAs layers embedded in a GaAs/AlGaAs p-i-n device employing a vertical cavity surface emitting laser structure was investigated as a possible scheme for current confinement. Two samples having similar structures, except for a thick AlAs layer embedded on top of the active region for one sample were grown by molecular beam epitaxy. Surface emission spectra of the two oxidized devices taken at room temperature showed a significant increase in total integrated intensity relative to the unoxidized samples. However, the degradation of satellite peaks owing to the reduction of cavity effects in the oxidized sample without thick AlAs layer implies a significant alteration in the quality of the mirrors due to oxidation. The presentation of satellite peaks in the other sample indicates that a thick AlAs layer intended for oxidation could also provide current confinement without significantly changing the cavity effect.

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Article ID

SPP-2003-2C-03

Section

Optics and Photonics

Published

2003-10-22

How to Cite

[1]
A Samson, F Agra, G Manasan, E Estacio, A Podpod, A Somintac, and A Salvador, Current confinement in an optical device using AlAs oxide, Proceedings of the Samahang Pisika ng Pilipinas 21, SPP-2003-2C-03 (2003). URL: https://proceedings.spp-online.org/article/view/SPP-2003-2C-03.