Angular scatter microscopy

Abstract

A new microscopy technique we call angular scatter microscopy (ASM) is proposed with the potential to map out the scattering particle distribution in various samples with high degree of localization and contrast. The method employs a widefield microscope with a variable aperture to introduce a frequency cut-off to the detected scattered light distribution. Numerical simulations of the imaging process indicate two-fold increase in signal contrast compared to conventional techniques. To further increase the contrast of the scattered image an experimental setup is proposed to reject the strong unscattered light. Because the protocol does not require scanning, fast changes in local particle distribution in cellular and material samples can be tracked and analyzed.