Plexiglass as a disposable sample-carrier for Total Reflection X-ray Fluorescence analysis

Authors

Vallerie Ann A. Innis ⋅ PH Applied Physics Research Group, Philippine Nuclear Research Institute
Pablo P. Saligan ⋅ PH Applied Physics Research Group, Philippine Nuclear Research Institute
Virginia S. Calix ⋅ PH Applied Physics Research Group, Philippine Nuclear Research Institute

Abstract

This paper discusses the suitability of plexiglass as a sample carrier for Total Reflection X-ray Fluorescence (TXRF) spectroscopy. An evaluation of the flatness and the roughness of the plexiglass surface was made and was compared to other optically-flat sample carriers. Fall-off of the Mo-Kα scattered peak was compared for plexiglass and quartz to evaluate penetration depth and reflectivity. Fluorescence intensities of the different elements on a multi-element standard prepared on both quartz and plexiglass substrate were compared. Signal-to-noise ratio (SNR) for a sample on plexiglass is only 0.5 times lower than sample prepared on quartz for the region below 10 keV for a tube voltage of 30 kV. Optimization of the measurement conditions was carried out by measuring angular-dependent signal and background intensities.

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Issue

2003: Proceedings of the 21st Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2003-1J-05

Section

Optics and Photonics

Published

2003-10-22

How to Cite

[1]

VAA Innis, PP Saligan, and VS Calix, Plexiglass as a disposable sample-carrier for Total Reflection X-ray Fluorescence analysis, Proceedings of the Samahang Pisika ng Pilipinas 21, SPP-2003-1J-05 (2003). URL: https://proceedings.spp-online.org/article/view/SPP-2003-1J-05.