Plexiglass as a disposable sample-carrier for Total Reflection X-ray Fluorescence analysis

Authors

Vallerie Ann A. Innis Applied Physics Research Group, Philippine Nuclear Research Institute
Pablo P. Saligan Applied Physics Research Group, Philippine Nuclear Research Institute
Virginia S. Calix Applied Physics Research Group, Philippine Nuclear Research Institute

Abstract

This paper discusses the suitability of plexiglass as a sample carrier for Total Reflection X-ray Fluorescence (TXRF) spectroscopy. An evaluation of the flatness and the roughness of the plexiglass surface was made and was compared to other optically-flat sample carriers. Fall-off of the Mo-Kα scattered peak was compared for plexiglass and quartz to evaluate penetration depth and reflectivity. Fluorescence intensities of the different elements on a multi-element standard prepared on both quartz and plexiglass substrate were compared. Signal-to-noise ratio (SNR) for a sample on plexiglass is only 0.5 times lower than sample prepared on quartz for the region below 10 keV for a tube voltage of 30 kV. Optimization of the measurement conditions was carried out by measuring angular-dependent signal and background intensities.

Downloads

Issue

2003: Proceedings of the 21st Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2003-1J-05

Section

Optics and Photonics

Published

2003-10-22

How to Cite

[1]

VAA Innis, PP Saligan, and VS Calix, Plexiglass as a disposable sample-carrier for Total Reflection X-ray Fluorescence analysis, Proceedings of the Samahang Pisika ng Pilipinas 21, SPP-2003-1J-05 (2003). URL: https://proceedings.spp-online.org/article/view/SPP-2003-1J-05.