Bandstructure characterization of GaAs/AlGaAs MQW of varying well widths and temperature using reflectance spectroscopy
Abstract
Temperature dependent reflectivity measurements were performed on GaAs/AlGaAs MQWs of widths 50Å, 90Å, and 120Å. Reflectance data shows three well-resolved peaks corresponding to 1HH-1C and 1LH-1C excitonic transitions and the HH continuum at temperatures up to 140K. A dielectric model was used to extract the values of these excitonic transitions. Comparison of the obtained values with the theoretical yields good agreement up to 140K before significant continuum contribution manifests.