Theoretical analysis of one-dimensional photonic crystal with defects
Abstract
This study determines the theoretical behavior of a one-dimensional photonic crystal (1DPC) with defects due to variations in indices of refraction and widths of the alternating dielectric media. These defects, termed in this study as the process controlled errors in the index of refraction (PCEIR) and in the width (PCEW), are evaluated at 4%–20% and 1%–5% errors respectively.
Effects of the PCEW and PCEIR on the behavior of a 1DPC with varying number of units (N) are simulated based on the T-Matrix method. 1DPC behavior is monitored through: i) minimum transmission; ii) transmission at 850 nm; iii) full width at half maximum (FWHM); iv) full width at 1/e maximum (FW1/e) transmission; and v) their standard deviations. The zero-defect 1DPC is used as a reference.
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