Total-reflection X-ray fluorescence spectrometry: An analytical tool for trace analysis of water samples

Abstract

The determination of trace elements in different water samples is becoming increasingly important. Depending on the purpose of the analysis the constituents of interest may be mineral contents, toxic trace elements such as As or Sc, or heavy metals such as Hg or Cd. The method of trace analysis thus plays a key role in the monitoring of safeness of drinking water as well as in the detection and diagnosis of existing water pollution and its hazards.
Trace analytical methods for these purposes, however, require techniques which allow determinations over a wide range of elements and at very low concentration levels. In addition, optimum techniques should offer the capability of multielement detection, high detection power, precision and accuracy, as well as simple and reliable calibration procedures. A relatively new technique, based on the phenomenon of total-reflection of x-rays, fulfills these demands to a great extent. This analytical tool is now known as Total-reflection X-ray fluorescence spectrometry (TXRF).