Total-reflection X-ray fluorescence spectrometry: An analytical tool for trace analysis of water samples
Abstract
The determination of trace elements in different water samples is becoming increasingly important. Depending on the purpose of the analysis the constituents of interest may be mineral contents, toxic trace elements such as As or Sc, or heavy metals such as Hg or Cd. The method of trace analysis thus plays a key role in the monitoring of safeness of drinking water as well as in the detection and diagnosis of existing water pollution and its hazards.
Trace analytical methods for these purposes, however, require techniques which allow determinations over a wide range of elements and at very low concentration levels. In addition, optimum techniques should offer the capability of multielement detection, high detection power, precision and accuracy, as well as simple and reliable calibration procedures. A relatively new technique, based on the phenomenon of total-reflection of x-rays, fulfills these demands to a great extent. This analytical tool is now known as Total-reflection X-ray fluorescence spectrometry (TXRF).
Downloads
Published
Issue
Section
License
By submitting their manuscript to the Samahang Pisika ng Pilipinas (SPP) for consideration, the Authors warrant that their work is original, does not infringe on existing copyrights, and is not under active consideration for publication elsewhere.
Upon acceptance of their manuscript, the Authors further agree to grant SPP the non-exclusive, worldwide, and royalty-free rights to record, edit, copy, reproduce, publish, distribute, and use all or part of the manuscript for any purpose, in any media now existing or developed in the future, either individually or as part of a collection.
All other associated economic and moral rights as granted by the Intellectual Property Code of the Philippines are maintained by the Authors.
