Fabrication of copper oxide electrode for supercapacitor application

Abstract

Copper oxide thin films were deposited on stainless steel substrates using spray pyrolysis technique and were subsequently annealed at 160°C and 400°C for two hours. Film annealed at 400°C shows the highest specific capacitance (C_s) of 136.55 mF at the scan rate 10 mV/s. The high C_s of this sample is attributed on the two factors, one is the intensity of the diffraction peaks and the other one is the morphology of the film as revealed by the x-ray diffraction (XRD) measurement and scanning electron microscopy (SEM).