Measuring the scale factor of digital micromirror devices using Bessel beams

Authors

  • Niña Angelica Fabroa Zambale National Institute of Physics, University of the Philippines Diliman
  • Jadze Princeton Casilana Narag National Institute of Physics, University of the Philippines Diliman
  • Nathaniel Hermosa National Institute of Physics, University of the Philippines Diliman

Keywords:

Bessel beams, pixelated devices, diffraction

Abstract

We determine the scale factor of a digital micromirror device (DMD) with the use of Bessel beams. The scale factor is the value related to how much a device stretches an image along a certain axis. In this paper, we have uploaded slits of varying scale factor s in the DMD and obtained the diffraction patterns formed by illuminating it. The structural shape and the line scan measurements of the captured images were compared to that of a numerically simulated image. Results show that the beam profiles generated with slits of s = 1.87 ± 0.03 have 5% deviation from the numerically simulated Bessel beam profile. This study is proof-of-principle that structured light can be used as tool for measuring the scale factor of a device.

Proceedings SPP 2017 Cover

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Published

2017-06-07

Issue

2017: Proceedings of the 35th Samahang Pisika ng Pilipinas Physics Conference

Section

Poster Session A (Materials Science, Instrumentation, and Photonics)

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How to Cite

[1]
“Measuring the scale factor of digital micromirror devices using Bessel beams”, Proc. SPP, vol. 35, no. 1, p. SPP-2017-PA-17, Jun. 2017, Accessed: Mar. 24, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/196