Synthesis of optical thin films by co-evaporation of copper and aluminum
Abstract
Thin films composed of 99.99% copper and 99.99% aluminum were fabricated through the process of thermal co-evaporation in high vacuum onto glass substrates where the real time monitoring of the rates of evaporation was done using two film thickness monitors. The resultant composite thin film material composed at a 50:50 component ratio underwent optical and electrical characterization and was shown to have had a high absorbance in the visible region and a resistivity of 7.87 ohms-cm.
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