Electrical properties of Schottky-Ohmic pair contact compared to Schottky-Schottky and Ohmic-Ohmic pair contact in planar configuration
Abstract
Schottky and Ohmic contacts were deposited on nGaAs substrates using AuBe and AuGe respectively fabricated in a planar configuration. Samples with finger patterns of Schottky-Ohmic pair, Schottky-Schottky pair, and Ohmic-Ohmic pair contact had their I-V characteristics measured. I-V characteristics were also measured after annealing the 3 samples at 460 C for 30 seconds. The Schottky barrier heights and series resistances were computed. It was observed that the electrical properties of the Schottky and Ohmic contacts used have certain effects on the Schottky-Ohmic pair.
Downloads
Published
Issue
Section
License
By submitting their manuscript to the Samahang Pisika ng Pilipinas (SPP) for consideration, the Authors warrant that their work is original, does not infringe on existing copyrights, and is not under active consideration for publication elsewhere.
Upon acceptance of their manuscript, the Authors further agree to grant SPP the non-exclusive, worldwide, and royalty-free rights to record, edit, copy, reproduce, publish, distribute, and use all or part of the manuscript for any purpose, in any media now existing or developed in the future, either individually or as part of a collection.
All other associated economic and moral rights as granted by the Intellectual Property Code of the Philippines are maintained by the Authors.








