Effects of thermal annealing on the composition of the metal-oxide phases in copper oxide thin films
Abstract
The effects of annealing temperature on the changes in the composition of metal-oxide phases present in copper oxide (CuxO) thin films were investigated. The CuxO thin films were synthesized on glass substrates through spray pyrolysis and subsequent thermal annealing. The surface morphology of the thin films was seen to be generally rough and that the thin films approximately have the same thicknesses. The thin films were shown to crystallize in the cuprous oxide (Cu2O) and cupric oxide (CuO) phases, with the diffraction peak intensities of each oxide phase varying with temperature. The ratio of Cu2O to CuO has been shown to decrease with annealing temperature as shown through the analysis of the UV-vis transmission spectra of the thin films. This implies that Cu2O transforms to CuO as the annealing temperature is increased.