Development of zinc oxide film as an anti-reflection coating for low-temperature-grown gallium arsenide infrared photodetector

Authors

  • Anthony Tuico Material Science and Engineering Program, University of the Philippines Diliman
  • John Paul Ferrolino National Institute of Physics, University of the Philippines Diliman
  • Gerald Angelo Catindig National Institute of Physics, University of the Philippines Diliman
  • Philippe Martin Tingzon Material Science and Engineering Program, University of the Philippines Diliman
  • Vernalyn Copa Material Science and Engineering Program, University of the Philippines Diliman
  • Elizabeth Ann Prieto National Institute of Physics, University of the Philippines Diliman
  • Elmer Estacio National Institute of Physics, University of the Philippines Diliman
  • Arnel Salvador National Institute of Physics, University of the Philippines Diliman
  • Armando Somintac Material Science and Engineering Program, University of the Philippines Diliman

Abstract

This work focuses on the signal enhancement from gallium arsenide photodetectors upon coating of an anti-reflection coating based on zinc oxide. The crystallinity and uniformity of the grown gallium arsenide substrate and the deposited zinc oxide film was confirmed using x-ray diffraction data and scanning electron microscope images respectively. Photocurrent spectroscopy presents the significant improvement in the spectral responsivity of the device upon deposition of zinc oxide film on the low-temperature-grown gallium arsenide infrared photodetector.

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Article ID

SPP-2015-PA-19

Section

Poster Session PA

Published

2015-06-03

How to Cite

[1]
A Tuico, JP Ferrolino, GA Catindig, PM Tingzon, V Copa, EA Prieto, E Estacio, A Salvador, and A Somintac, Development of zinc oxide film as an anti-reflection coating for low-temperature-grown gallium arsenide infrared photodetector, Proceedings of the Samahang Pisika ng Pilipinas 33, SPP-2015-PA-19 (2015). URL: https://proceedings.spp-online.org/article/view/1178.