Diamagnetism and weak link behavior of In-doped Bi-2212
Abstract
Bulk samples of indium-doped Bi2Sr2−xInxCaCu2O8+γ for x = 0, 0.10, 0.20, 0.30, 0.40, 0.50, 0.60, 0.70, and 0.80 were fabricated thru solid state reaction process. AC magnetic susceptibility was measured at low applied magnetic field. For x = 0 to 0.50, two separate in-phase responses were obtained suggesting that the samples were weakly coupled. For x = 0.60 to 0.80, the two in-phase responses coincide indicating stronger coupling of grains. XRD results confirmed that indium doping may have saturated at x = 0.60 to 0.80, while SEM shows wider plates and adhesion of grains at increasing doping concentration.