Optical characterization of tin oxide-coated porous silicon

Authors

  • Joybelle M. Lopez Materials Science and Engineering Program, University of the Philippines Diliman
  • Arven I. Cafe National Institute of Physics, University of the Philippines Diliman
  • Laureen Ida M. Ballesteros Materials Science and Engineering Program, University of the Philippines Diliman
  • Lorenzo Lopez, Jr. Materials Science and Engineering Program, University of the Philippines Diliman
  • Maria Angela B. Faustino Materials Science and Engineering Program, University of the Philippines Diliman
  • Arnel A. Salvador National Institute of Physics, University of the Philippines Diliman
  • Armando S. Somintac National Institute of Physics, University of the Philippines Diliman

Abstract

Fabrication and characterization of tin oxide-coated porous silicon are presented. The effects of varying the current density and thickness during the electrochemical etching of the samples were investigated. Also, tin oxide was successfully deposited on porous silicon through nebulized spray pyrolysis. Initially, the refractive indices of pSi samples varied at various thicknesses of 500 nm, 800 nm and 1500 nm were 1.76, 1.51 and 1.37, respectively. However, for samples coated with tin oxide, refractive indices obtained from reflectance spectra were 2.08, 1.62 and 1.31, respectively. Porosity in porous silicon is greater than that of porous silicon-oxide.

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Published

2015-06-03

Issue

Section

Condensed Matter Physics and Materials Science

How to Cite

[1]
“Optical characterization of tin oxide-coated porous silicon”, Proc. SPP, vol. 33, no. 1, pp. SPP–2015, Jun. 2015, Accessed: Mar. 26, 2026. [Online]. Available: https://proceedings.spp-online.org/article/view/1105