[1]
Quema, A., Migita, M., Nashima, S. and Hangyo, M. 2000. Terahertz-time domain spectroscopic (THz-TDS) measurement of moderately-doped silicon using InAs emitter under magnetic field. Proceedings of the Samahang Pisika ng Pilipinas, 18(1), SPP-2000-SP-15. URL: https://proceedings.spp-online.org/article/view/SPP-2000-SP-15.