[1]
Mangila, N., Borja, C.A., Semblante, O., Ceniza, C., Salvador, A.A. and Somintac, A.S. 2010. Estimation of refractive index for thin film aluminum nitride on quartz substrates using envelope method. Proceedings of the Samahang Pisika ng Pilipinas, 28(1), SPP-2010-PA-44. URL: https://proceedings.spp-online.org/article/view/SPP-2010-PA-44.