[1]
Badiola, R.A., Semblante, O., Ceniza, C., Loberternos, R., Balat, R. and Sarmiento, R. 2015. Determination of thickness and index of refraction of ZT (ZrO2+Ta2O5) thin film using Swanepoel method. Proceedings of the Samahang Pisika ng Pilipinas, 33(1), SPP-2015-5A-03. URL: https://proceedings.spp-online.org/article/view/1135.