Bautista, G., Blanca, C.M. and Saloma, C. 2006. Tracking the onset of defect in light emitting semiconductor devices via two-photon excitation microscopy and spectral microthermography. Proceedings of the Samahang Pisika ng Pilipinas, 24(1), SPP-2006-3A-04. URL: https://proceedings.spp-online.org/article/view/SPP-2006-3A-04.