Bautista, G., Delica, S., Blanca, C.M., Buenaobra, B. and Saloma, C.A. 2005. High contrast component discrimination and failure localization in integrated circuits using spectral reflectance microscopy. Proceedings of the Samahang Pisika ng Pilipinas, 23(1), SPP-2005-3A-02. URL: https://proceedings.spp-online.org/article/view/SPP-2005-3A-02.