Narag, J.P.C., Hermosa, N., Sagisi, J.L. and Zambale, N.A. 2019. Goos-Hänchen shift: An optical phenomenon to measure thin film thickness of SiO2. Proceedings of the Samahang Pisika ng Pilipinas, 37(1), SPP-2019-3B-06. URL: https://proceedings.spp-online.org/article/view/SPP-2019-3B-06.