Evaluation on the applicability of fringe projection profilometry in warpage measurement of semiconductor packages - Palarion, Angelie B.; Rendon, Mary Ann; Semblante, Oliver; Loberternos, Regine; Ceniza, Claude; Castañares, Michael Lawrence; Tallo, Francis; Violanda, Renante; Cruz, Erwin Victor; Sarmiento, Raymund (Proceedings of the 33rd Samahang Pisika ng Pilipinas Physics Congress, 2015)